6533 Built-In-Test (Self Test)

I'm using a DAQCard 6533 Digital I/O card and my customer requires I test the card for proper functionality before each use.
Most COTS hardware vendors today provide Built-In-Test (BIT) and I assume NI does for the 6533, too.
So, before I add another several weeks to my schedule to write my own BIT, I'd like to know how the 6533 tests itself or how I can call a routine that will execute a 6533 BIT routine.
Any info would be helpful.
Thanks

Hello,
Although I know that there is an E-Series Diagnostic Utility available for the MIO boards, I do not know of any Built-In-Test routine for the 6533.
At this moment I will advise to write a custom BIT routine based on the NI-DAQ shipping example programs for this Digital I/O board (653X).
Hope this information helps and good luck with your application!

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Attachments:
Pattern-Burst-1Board-Continuous.llb ‏152 KB

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I am currently using a DAQCard-6533 board which is very similar to the 6534 (doesn't have the deep memory and uses interrupts instead of DMA for transfer). All I did was change the "Transfer Method" to Pattern I/O, and reduced the clock frequency and buffer size to 1000 (because I am using interrupts and no onboard memory). I then connected REQ1 to REQ2, DIOA[0:7] to DIOC[0:7] and DIOB[0:7] to DIOD[0:7]. Everything ran well at that point.
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fer rates (one way). I just assumed that performing input or output didn't affect the bandwidth.
Performance Benchmarks For The High-Speed Digital I/O - NI 653x
http://digital.ni.com/public.nsf/websearch/4FCA248D888831C386256D8900563E45?OpenDocument
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If your problem is solved please click the "Accept as Solution" button ------------V
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http://digital.ni.com/softlib.nsf/MainPage?ReadForm&node=132010_US
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Did someone help you today? Press the star on the left to thank them with a Kudo!
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Message was edited by: Jay

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ShaBZ ~~

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>>>>>>
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~~~~~~~~~~
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6533 Built-In-Test (Self Test)

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