Two external trigger signal

Hello guys,
I want to use two external trigger signals for the system. But when I use the C# function "ConfigureDigitalEdgeTrigger", it just creats one external trigger port.
How can I creat two ports for two external trigger signals?
Thanks !

Kristian;
I don't believe the problem you are seeing there is related to the external trigger connection, but to a too small interchannel delay in between channels.
If you don't give enough time to teh interchannel delay, the instrumentation amplifier might not have enough time to settle properly, so you will always see the signal that is connected to the previous channel on that channel, regardless what you have connected to the second channel.
The AI Config.vi has an input for you to change the interchannel delay of your acquisition.
Hope this helps.
Filipe A.
Applications Engineer
National Instruments

Similar Messages

Multiple recording of waveforms using an external trigger signal

Dear all,
Maybe somebody could help me with the following:
System:
Windows 2000,Pentium III,~800-900MHz,32-bit master PCI bus,256 MB RAM
PCI-NI 5122 Digitizer
PCI-GPIB card
PCI-DAQ card
Labview 7.1
NI Scope 2.7
Problem:
I want to acquire multiple waveforms (e.g. 100) using an external TTL trigger signal of ~40Hz. I have to acquire 1 waveform per trigger signal i.e. 100 subsequent trigger signals will acquire 100 subsequent waveforms.
After, or during the waveform acquisition (?), I have to transfer the waveforms as 100 1D-arrays from the onboard memory of the digitizer through my fitting routine (one-by-one!). The fitting routine accepts one waveform (1D-array) at the time, fits the waveform and calculates 1 fit-value per waveform. So, when I pass the acquired 100 waveforms subsequently through the fitting routine, I need to get out a 1D-array with 100 fit-values. This 1D-array with the 100 fit values will be further processed and a final value will be saved.
This procedure will repeat itself at different points in a sequence structure. The sequence structure will be located in a loop and running for several hours!
Please see attached program flow diagram.
Qustions:
1. When I want to acquire 100 waveforms using 100 subsequent trigger pulses, the attached VI (Multiple_record VI) gives me the following error message:
ERROR
"Possible reason(s):
Driver Status: (Hex 0xBFFA4009)
A previous acquisition is still in progress. If you are attempting to change an attribute, note you can only change fetch attributes while an acquisition is still in progress.
Status Code: -1074118647
What am I doing wrong? Is there a better and more efficient way to do this?
2. How can I transfer the 100 waveforms from the digitizer, one-by-one as 1D-arrays, through my fitting routine? A waveform will have ~2000-3000 data pts. (DBL type). Remember: I DO NOT HAVE TO SAVE THE WAVEFORMS!
3. Which way is faster, and more efficient (memory) for my PC system to transfer the waveforms from the onboard memory of the digitizer to the fitting routine?:
a) Start transfer of already acquired waveforms (1D-arrays), one-by-one through the fitting routine, during the waveform acquisition process is still in progress?
b) First, acquire the 100 waveforms (1D-arrays), store them in the onboard memory (digitizer) and then transfer them one-by-one through the fitting routine?
4. How can I make sure that after the waveforms were transferred through the fitting routine, the onboard memory of the digitizer is EMPTY (clear waveforms which have already been fetched) and ready to repeat the waveform acquisition at a different point of the sequence structure?
5. I do not want to display each acquired waveform because I think it will slow down the acquisition process. Instead, I want to display the last of the acquired 100 waveforms, so I can check my fit and maybe adjust the fit-parameters. How can I do that?
I think the important thing is to perform this process in the fastest way possible with the best use of the PC resources (memory etc.) because this process will run for hours. Any suggestions?
It would be very nice if somebody could give me some help with this.
Kind regards,
beam
Attachments:
program flow diagram.vi ‏11 KB

The method you use to analyze your data is fine. The only thing I would watch out for is memory problems. If you keep with the numbers you gave earlier, 100 waveforms at 3000 pts/wfm, you will be transferring 2.4MBytes of data per set. This is way over the 1MByte buffer NI-SCOPE uses for data transfer. It will work, but it might be slow. If you have problems, switch to niScope Fetch WDT.vi for your acquisition and move it inside the loop. Before you call the fetch VI, set the record it will fetch by using the property node and setting Fetch->Fetch Record Number using your loop index.
A couple of other performance tips I think you probably know. The graph inside the loop will slow you down a lot. In addition, the graph of all the data outside the loop will also take a fair amount of time (plotting 2.4MBytes of data). If you want to see just the last waveform, pop-up on the terminal going out of the loop and disable indexing so only the last waveform goes through, not all of them.
Your analysis method should work fine. You may consider doing an I16 fetch instead of the WDT fetch you are currently using. This will reduce your memory usage by a factor of four, provided you don't immediately convert it to a double array. If your analysis is actually finding a max/min, this is faster on an integer array than a double. You can scale the integers using the numbers in the information cluster. It is much faster to scale one integer at the end than a whole array. That said, the I16 fetch is not particularly faster than the WDT fetch, just less memory. This choice will depend on your analysis.
The min record length is the minimum number of points the device will acquire. The actual record length is different if the acquisition rate you ask for is not one of the acquisition rates the device is capable of. The acquisition rate is then coerced to the next highest rate and the record length increased so your acquisition time remains constant. This behavior is part of the IVI specification for digitizers. Using your VI as an example, you ask for 300kS/s acquisition rate and 800 data points. What you actually get is 300,300.3003 S/s and 801 data points. The sample rate is determined by an integer divisor from 100MHz, in this case 100,000,000/333. So, if you really want a certain number of data points, you need to set the sample rate to a physically realizeable one. Alternately, you can just fetch the number you want instead of all the points, realizing your sample window will be a bit shorter than you asked for.
You are correct. To see anything in the records done, you need to delay. However, in this code, the records done output is really not doing anything. The fetch won't fetch until everything is done, so you know all is finished when your data shows up. I would just delete it. If you do want to put a delay in, wrap a sequence structure around the records done query. Add a frame before the current frame and drop a Wait (ms)delay into it. You can find this primitive in the timing and dialog palette. This is an example of when the sequence is actually useful. The delay VI has no good way of enforcing data flow, so the sequence does it.
The way you have implemented it, you don't need to poll acquisition status. To get acquisition status, use niScope Acquisition Status.vi. You would put this in a WHILE loop before your acquire and exit the WHILE loop when the acquisition was done (or an error occurred) to proceed to the acquisition. Make sure you also put an appropriate delay in the WHILE loop or it will eat your entire processor capacity. The delay should be based on how long you expect the acquisition to take.
You should definitely put your fetch code in a subVI if you are going to call it more than once. LabVIEW makes it easy. Select the code you need to make into a subVI, then select Edit->Create SubVI. Don't forget to put an icon and documentation in the subVI. You will thank yourself later.
Let me know if you have any more questions...
This account is no longer active. Contact ShadesOfGray for current posts and information.

How can I use counters to read the difference between two external pulse signals?

I generated a pulse signal and sent it to a sensor which in turn gives me a pulse signal back. I need to read the time from which the sent the signal goes high to the time that the signal is returned. How can I read this? the diagram is attached
Attachments:
Timing_Diagram1.doc ‏256 KB

There is vi called "Two Edge Separation Mesurement (NI-TIO).vi". In LV6.1 it is in "c:\...\LabVIEW 6.1\Examples\DAQ\Counter\ni-tio.llb".
Unfortunately this function has no timeout. This means that your program will hang on if there are no pulses. I have attached an improved version of this vi with a timeout(sorry for the french text in the description). There are also some other improvements like the calculation of the edge separation in seconds (not only clock counts).
This function will only work with NI-TIO cards (like 660x).
Attachments:
Two_Edge_Separation_Measurement_with_Timeout_(NI-TIO).vi ‏103 KB

Data-acquisition with NI 6036E DAQ card & GPIB using an external trigger

Hi all,
I hope somebody could give me some help with the following and answer some questions:
Simple system description:
Labview 6.1
PCI-GPIB card
6036E DAQ card
In my system, I am using an external analog trigger signal (A) for continuous data-acquisition. Characteristics of the analog trigger signal (A) are: ~40 Hz, signal height +1.48V, triggered by rising edge (the analog trigger signal (A) could be changed to a TTL signal). Each data-acquisition is done within ~1.0 ms after the rising edge of the trigger pulse. The timing of the data-acquisition and analyzing procedure is controlled by execution in a sequence structure placed in a loop.
Now, I connected a power meter to the system, to measure the laser power during the data-acquisition. The power meter has two options to provide the laser power data:
a) via analog signal output (voltage corresponds to laser power in watts)
b) via GPIB (direct output reading of laser power in watts).
Problem:
During a certain point in my data-acquisition sequence structure (defined by a frame), I want to use the next occuring analog trigger signal (A) to acquire 1 value from the power meter.
How do I do this in Labview programming for the following two situations?
a) If I connect the analog output from the power meter to an analog input channel of the 6036E DAQ card. The analog trigger (A) would be connected to a second analog input channel (In case the analog trigger signal (A) is changed to a TTL signal it would be connected to the PFI0/Trig input pin on the DAQ card).
b) If I use the GPIB connection of the power meter. The analog trigger (A) would be connected to a second analog input channel (In case the analog trigger signal (A) is changed to a TTL signal it would be connected to the PFI0/Trig input pin on the DAQ card).
An other possibility would be to trigger the power meter directly, so it outputs constantly power meter values at ~40 Hz. How could I than acquire 1 power meter value (at a certain time im my sequence structure) via analog input at DAQ card or GPIB?
Additional questions:
How do I configure the PFI0/Trig pin on the 6036E DAQ board individually as an INPUT?
How do I use an analog trigger signal (A) as counting signal for a loop, or as an activation signal for a sequence structure which includes GPIB commands?
It would be very nice if somebody could give me some help.
Kind regards,
beam

Hi beam,
I just want to verify that I understand your situation correctly:
An external trigger signal (A) is wired to one of your input channels (e.g. CH0) to trigger data acquisition of a second channel (e.g. CH1). Your power meter is connected to an analog input channel, which you would like to trigger with a certain rising edge at some of your sequence structure.
Problem:
During a certain point in my data-acquisition sequence structure (defined by a frame), I want to use the next occuring analog trigger signal (A) to acquire 1 value from the power meter.
How do I do this in Labview programming for the following two situations?
a) If I connect the analog output from the power meter to an analog input channel of the 6036E DAQ card. The analog trigger (A) would be connected to a second analog input channel (In case the analog trigger signal (A) is changed to a TTL signal it would be connected to the PFI0/Trig input pin on the DAQ card).
If a task has been configured to acquire signal from one analog channel, it's not possible to run a second analog input task or to add a second channel on the fly. You had mentioned that it's possible to read from the instrument through GPIB. Is it possible to perform a software trigger such that at a certain frame of your structure, when the trigger signal A reaches voltage "x", a GPIB command is written to your power meter to query a measurement reading?
Additional questions:
How do I configure the PFI0/Trig pin on the 6036E DAQ board individually as an INPUT?
You do not need to explicitly configure the PFI0 line as an input. If you want to use it as an input such that it acts as an analog trigger, simply wire the trigger signal to this pin. When configuring the trigger in your software, specify PFI0 as the trigger source.
How do I use an analog trigger signal (A) as counting signal for a loop, or as an activation signal for a sequence structure which includes GPIB commands?
You can try using the Limit VI to find out when the trigger signal reaches a certain level, and count how many times this level is reached. Similarly, you can use this as the condition to execute GPIB commands.
Hope this helps,
Lesley

External trigger ni pxi 5122

hello,
i want to generate an external trigger signal for an ni pxi 5122 to launch a specific line video : HD(720p,1080i).
what is a form of this external trigger ?

Hello,
Based on the Specifications Manual (pages 18 and 19) this module will accept a voltage signal from -5V to +5V.
http://www.ni.com/pdf/manuals/371172m.pdf
Please refer to the links below for more information about Video Triggering.
http://www.ni.com/white-paper/3735/en/
http://zone.ni.com/reference/en-XX/help/370592E-01/digitizers/5122_video_triggering/
Regards,
MCOTO.

How to sync. 50Hz sample rate with 5Hz external digital trigger signal?

Hello there,
I want to sample an analog input at 50Hz, where I further want to use
the 5Hz PPS signal of a GPS receiver as an external trigger/clock
signal for the NI DAQ USB-6008 device. However, I do not want to read
10 samples every 200ms (= 50Hz avg. sample rate), but I want to read 1
sample every 20ms, i.e. with "real" 50Hz.
The "natural" way, it seems would be to use a task that waits for a
rising edge on the ext. trigger input, then reads 10 samples, then
waits for the next trigger edge, and so on.
However, it seems that with this approach I cannot read the data from
the DAQ with real 50Hz, further it seems that every 10 samples the task
needs to be restarted, which takes longer than the 20ms (corresponding
to the 50Hz target sample rate).
I hope the problem description is clear enough....
Thank you in advance for any advice.
Regards,
Oliver

You have to use the counter together with the analog input to achive this. You could configure the counter to generate 10 pulses with 50 Hz whenever the counter sees a rising edge on the inpput of the counter. The output of the counter would be used as the external clock for the analog input.

External trigger on PXIe 5672

Dear all,
I have two questions on 5672:
1.Is script the only way to control a external tigger?If not,What are other methods?
2.How can I konw a external trigger comes through LaBVIEW,or in other words,Is it possible that LabVIEW will get a signal when a external trigger comes.
Waiting for your replies.
Oshirs

The 5672 supports two types of triggers:
1) start trigger
2) script trigger
I assume you need more than just a simple start trigger. To answer your question, yes, you must use a script in order to use script triggers.
Once you initiate a script, there isn't a way to query the device to figure out which script instruction the device is currently executing. Of course, if you can control the external trigger in LabVIEW, then you should know where in the script the 5672 is at. So you may want to pursue the problem from that end.
Hope this helps!

How to externally trigger the execution of TestStand with a start and abort button through a digital interface?

Hello,
I'm Currently evaluating TestStand as an alternative for an in-house developed Test Sequencer.
To start our own Test Sequencer we use a small box, connected to a DIO board. The box has a start button and an abort button. The box also has a pass, a fail and a running led.
The interface with this box is made via some digital lines of a PCI-DIO-96.
In our own Test Sequencer we have groups named Init, Run, Abort, Exit.
The Init group is executed at startup (only once). It is used to initialize all the HW and SW. -> I guess this is the Pre UUT Loop callback in TestStand.
The Exit group is only executed once at the end of the day when the application is terminated. It is used to free all the used hardware and cleanup all the resources. This probably is the Post UUT Loop Callback in TS.
When a product needs to be tested, the operator presses the "start" button which triggers our own Test Sequencer and the run and abort group are being executed (first the run group, afterwards the abort group).
When the product is being tested the "running led" of the little box lights up to indicate to the operator that the application is running. (only when the run and abort group are running)
The Run group has all the functional tests in it. (MainSequence)
The abort group is used to put everything back in it's original state after the test on this single product is done. (Post UUT)
When executing the tests and something goes wrong (operator gets stuck in a clamper, ...) the operator can still press the abort button and then the execution immediately jumps from the currently executing step in the run group to the first step of the abort group. So, when something goes wrong, immediately the abort group is called.
At the end of the run and abort group, if no errors occured, the "pass led" lights up. If one or more steps went wrong the "fail" led lights up.
This setup can also be used to test multiple product in parallel. At that time all the different parallel testers have such a small box which contains a "start" and "abort" button and a pass, fail and running led. (it is possible that they are all connected to the same PCI-DIO-96 board. )
My question:
Is it possible to do something similar like this in Teststand? If yes, is there an example available that shows me how to do this in TestStand? (externally trigger the execution of TestStand)
Typically, in the Init group (Pre UUT Loop) the digital interface box gets initialised.
In the Close group (Post UUT Loop) the digital interface box is taken out of scope.
Note: The PCI-DIO-96 board to which the digital interface box is connected will also be used in the rest of the developed application (MainSequence, ...)
What's really important for me is that I can create a process model that all the application developers in our organisation can use. I really don't want any of the application developers (limited software experience) to mess around in all the features of TestStand.
For them it's important that they just add the function DigitalInterfaceBoxInit () in the Pre UUT Loop Callback and the DigitalInterfaceBoxClose () in the Post UUT Loop Callback, and then everything works!
It is important that the appliation developers do not have to create any global variables, other functions, synchronisations, parallel sequences, ... in TestStand. All this needs to be done with a simple call to the DigitalInterfaceBoxInit function.
Thanks in advance for all the help!
Best Regards,
Dennis Vanotterdijk
[email protected]

Dennis-
Your application sounds very well suited to TestStand's abilities. I am also quite impressed with your knowledge of how TestStand's architecture is arranged when you are still just considering whether or not to use it.
I think that TestStand would work really well for you in this application. Like you mentioned it will provide you with a form of standardization for your application developers to work from. It also provides the flexibility for you to add your custom routines in many different places. TestStand also makes parallel and batch testing much easier in TS 2.0 so that you could develop one test for your product and execute different instances of it in parallel to test multiple products at once.
As for your specific question about how to c
ontrol TestStand using a DIO board. I think this is very feasible and should not be too difficult. Since TestStand provides you the ability to create a custom operator interface your operator interface could monitor the status of your DIO board and launch/abort executions based on the read values. Usually the executions are launched/aborted when a button on the GUI is pressed however, I do not see any thing different about basing the action on a DI signal vs a mouse click. I am sure your application is more involved than this high level description but from the sounds of it I think it is very possible to do with TestStand.
Based on my experience of building test systems with TestStand and your description of the application, I would feel very confident in using TestStand to achieve all the goals you mentioned. If you have further detailed questions on how one of your features might be implemented, feel free to contact one of our Application Engineers or email us at www.ni.com/ask
and we would be glad to help you.
Best regards,
Richard McDonell
National Instruments

Satellite P100: Can I connect two external monitor to VGA & DVI port at the same time?

The Satellite P100 comes with two external monitor port. A VGA and a DVI. Can you have have two external monitor working at the same time? Can you have two external monitor as well as your internal display working at the same time (for a total of 3 display at the same time?
Here is what I have confirm:
Internal display + DVI connector display
OR
Internal display + VGA connector display
Is it possible to have:
DVI connector display + VGA connector display?
OR
DVI connector display + VGA connector display + Internal display?

As far as I know this is not possible and you can use either DVI or VGA port.
For signal output can be used only one port for external display.

How to connect external trigger PCIe-1433?

I am having an issue getting the external trigger to work using a cameralink camera, a PCIe-1433 card and a signal generator. The signal generator is connected to the SMB connector on the 1433 card and is providing a 20 Hz signal with a 20ms pulse width at TTL voltages (0-4V). From memory, we are using the MAX software and under the Acquisition tab I have CC1 set to external, however the camera is not receiving this external trigger.
I've attached a rough diagram of our setup.
What could my issues be? My thoughts are:
1) Are there other settings in MAX I need to ensure? I know the SMB connector can be an input or an output. How can I make sure this is set to input?
2) My input signal is 0-4V which is TTL, but does the signal need to be 0-5V?
Any thoughts would be greatly appreciated. Thank you.
Attachments:
ExternalTrigger.jpg ‏29 KB

Hello tuckturn
Thank you very much for getting in touch with us.
1) In Measurement and Automation Explorer, the default is an input. You would need to use LabVIEW to change the SMB connector to be an output. Can you please show me a screenshot of your camera attributes in Measurement and Automation Explorer.
2) Where does this input signal come from? Do you have a 5V TTL compliant output to test this? Can you please provide me the specification for whatever device is outputting the voltage?
Thanks again.
Sincerely,
Greg S.

How to connect external trigger PCI-1433

Hi all:
I met the same problem as this old post: https://forums.ni.com/t5/Machine-Vision/How-to-connect-external-trigger-PCIe-1433/m-p/1677560/highli...
however the post did not give solution.
I am having an issue getting the external trigger( from PCI 6259) to work with a cameralink camera, a PCIe-1433 card . The PCI 6259 is connected to BNC 2111, the output trigger signal from CTR0 is connected to the SMB connector on the 1433 card and is providing pulse train at TTL voltages (0-5V). Using the MAX SOFTWARE and under the Acquisition tab I have CC1 set to external 0, however the camera is not receiving this external trigger. The camera is Basler 4096-140km.
I measured the ouiput signal from CTL0, the sigal seems good.
I tried RTSI trigger before, failded. I thought SMB should be more straight forward, seems I was wrong.
Looking forward to reply!
Attachments:
camera configuration.jpg ‏168 KB
External Camera Trigger(SMB).vi ‏57 KB

Bobjojo,
You will actually need to affect the properties of both the camera and the frame grabber to take advantage of this triggering mode. I found a document that contains a good run down of the process to acquire in this mode (linked below). As far as the programming for the acquisition is concerned, the frames will be built at the driver level for the specified frame height. This means that the IMAQ driver will composite the line scans for you, and any simple acquisition (the document shows using the Vision Acquisition Express VI) will be able to pull the image into LabVIEW.
www.ni.com/white-paper/13786/en/pdf
Karl G.
Applications Engineer
ni.com/support

NI-5122 measure trigger frequency of TTL trigger signal

I have two signal channels and a TTL trigger signal on my NI-5122. The frequency of the tigger signal is between 5 and 30 Hz. Before I want to sample the two signal channels I need to know the actual trigger frequency to calculate and set sampling rate and number of sampling points. I use LabView 7.1
What's the best way to measure the frequency (5-30 Hz) of the TTL signal connected to the 5122 trigger input?
many thanks for your help.
Markus

Jason V,
thanks for your help. So there is no programable counter on the 5122...
My freuqency is constant and I need an accuracy of <1%.
What I did meanwhile:
I make a loop of e.g. 10 triggerevents.
I record the times when the trigger events occur.
After the loop I fit a line to the time vs. iteration number.
This gives a pretty good value for the period, hence I get the inverse frequency.
I need 10-30 trigger events to be accurate.
For 10 Hz this makes 1-3 seconds init at the start of each measurement.
I can reach a relative error as low as 1e-4. That's o.k.
I did some more tweaking to allow for missed trigger events.
The whole VI works fine to retrieve frequencies up to 100 Hz.
For higher frequencies I am limited due to the millisecond resolution of LabViews 'Tick' vi.
====
For higher frequencies I would program a counter:
Start a measurement for 1000 scans and measure the time for that.
However, this is not accurate enough for low frequencies and short recording times (10-30 trigger events).
====
I also thought about Fourier transforming the signal itself and locating the peak frequency.
Same as above: This is only accurate when I record many periods.
====
The fastest and most accurate solution would be to sample the trigger signal itself.
Then I would need only one period and could detect the trigger slopes with microsecond resolution.
However, I need both input channels for recording simultaneous signals.
Conclusion:
(1) The NI-5122 does not has a programable counter on board
(2) For my application I found a solution tht works.
MarkusMessage Edited by Nepu on 03-09-2005 02:04 AM
Message Edited by Nepu on 03-09-2005 02:07 AM

How do I auire data at every third pulse of an external trigger?

I need to aquire 2048 data points where each one is triggered by the third pulse of an external trigger (TTL). Currently I can aquire 2048 data points where each is triggered by every pulse of an external trigger but I need to be able to do this at every third trigger pulse. It seems that I can't do this simply by entering "2" into the "skip count" input of the "Additional Trig Parameters' input of the "AI Start" VI. My attempt is in the VI titled TriggerScanA.
Further more I will need to know the actual trigger scan rate for data analysis. This is also prooving difficult since even when I am triggering off every external trigger pulse the actual scan rate only returns zeros. My attempt is i
n the VI entitled TriggerScanB.
Thankyou.
Attachments:
Trigger_Scan_VI's.llb ‏211 KB

Greetings,
This sounds like an interesting application. I would suggest that you use your external pulse train as a scan clock, not as a start trigger. Furthermore, since you want to acquire data every third pulse, you will need to use one of your device's counters to divide-down this signal. To accomplish this task, you will need to configure the counter for pulse train generation with an external source - your external pulse train. You will then need to choose the correct "raw counts" to generate a pulse train with a frequency that is 1/3 of that of your external signal. I would suggest that you examine the example Generate Pulse Train (DAQ-STC).vi for this purpose. Now, you can perform a finite analog input acquisition of 2048 data points u
sing this pulse train as your scan clock. Finally, to determine the frequency of your scan clock, you will need to us your device's other counter to perform a frequency measurement of either pulse train.
I believe that this will be your best approach to accomplishing this task. Good luck with your application.
Spencer S.

How to use an external trigger on an electrometer (KEITHLEY 6517A)

I'm really new using LABVIEW, so please, be patient with me...
I'm using a KEITHLEY electrometer to acquire data from a dosimeter. We are going to do some measurements on a pulsed source and before the pulse there's a trigger signal. I don't know the size of the trigger, I'll just know that when I start my measurements (in another lab) So I would like to implement a case were the user can decide the value of the external trigger, so this information goes to the eqipment before starting the measurement.
What I would like to know is... Someone can give me a hint on how to do that? I'm using GPIB and LABVIEW 7.1. and I already took all the 6517A libraries for labview.
Thank you all

The external trigger on a 6517 is a TTL signal. Any pulse higher than 3.4V will trigger it. You cannot program the threshold level.
You can set the delay programmatically with TRIG: DEL <n> command.
ref: page 2-81 and following of User Manual
Message Edited by normandinf on 10-21-2008 03:55 PM

How to use scb-68 board to send a trigger signal

I am using Labview 8.5. Our DAQ card is scb-68. I want to send a trigger signal out by using the DAQ. Could anybody tell me how to do that?

There is a program in another computer waiting for the trigger signal. We don't need to worry about that computer.
We had a program which can collect data from a temperature controller. When the program start, it also sends a trigger singal out so that the two computers can work simultaneously. But now our temperature controller is changed to a new one. I've built a program to collect data. All what I need now is just sending a trigger signal when the program starts.
One attachment is the former program (writted by using Lab windows), another attachment is my new VI for trigger signal.
Attachments:
trigger4.vi ‏28 KB
diode_scan3.c ‏12 KB

Two external trigger signal

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